Texas Instruments LMG1025-Q1EVM Evaluation Module (EVM)
Texas Instruments LMG1025-Q1EVM Evaluation Module (EVM) is designed to evaluate the LMG1025-Q1, an automotive single-channel low-side gate driver. The evaluation module consists of one Gallium Nitride (GaN) enhancement mode FET driven by one LMG1025-Q1. The drain of the GaN FET is connected to an onboard resistive load representing a typical laser diode load for LiDAR (Light Detection And Ranging) applications. The Texas Instruments LMG1025-Q1EVM has a load resistor (R5–R8) that must be replaced with a laser diode. The evaluation module is designed to accelerate the evaluation of the LMG1025-Q1. The evaluation module is not intended to be used as a standalone product but to evaluate the switching performance of LMG1025-Q1.Features
- Demonstrates driver capability of 1-2ns pulses > 50A
- Extremely short propagation delay: 3ns typical, 4.5ns max
- 550ps typical rise/fall time
- Schmitt-trigger type CMOS inputs for robustness
- Advanced layout with < 500pH of inductance
Kit Contents
- LMG1025-Q1EVM evaluation module
- User's guide
- Safety instructions
- Laser not included
Videos
Test Setup
Publicado: 2020-01-16
| Actualizado: 2024-05-06
