Texas Instruments LMG1025-Q1EVM Evaluation Module (EVM)

Texas Instruments LMG1025-Q1EVM Evaluation Module (EVM) is designed to evaluate the LMG1025-Q1, an automotive single-channel low-side gate driver. The evaluation module consists of one Gallium Nitride (GaN) enhancement mode FET driven by one LMG1025-Q1. The drain of the GaN FET is connected to an onboard resistive load representing a typical laser diode load for LiDAR (Light Detection And Ranging) applications. The Texas Instruments LMG1025-Q1EVM has a load resistor (R5–R8) that must be replaced with a laser diode. The evaluation module is designed to accelerate the evaluation of the LMG1025-Q1. The evaluation module is not intended to be used as a standalone product but to evaluate the switching performance of LMG1025-Q1.

Features

  • Demonstrates driver capability of 1-2ns pulses > 50A
  • Extremely short propagation delay: 3ns typical, 4.5ns max
  • 550ps typical rise/fall time
  • Schmitt-trigger type CMOS inputs for robustness
  • Advanced layout with < 500pH of inductance

Kit Contents

  • LMG1025-Q1EVM evaluation module
  • User's guide
  • Safety instructions
  • Laser not included

Videos

Test Setup

Chart - Texas Instruments LMG1025-Q1EVM Evaluation Module (EVM)
Publicado: 2020-01-16 | Actualizado: 2024-05-06