Texas Instruments UCC5881-Q1 Gate Driver
Texas Instruments UCC5881-Q1 Gate Driver is an isolated, configurable, and adjustable drive strength gate driver designed to drive high-power SiC MOSFETs andIGBTs in EV/HEV applications. This driver integrates diagnostics and detection functions to simplify the design of ASIL-compliant systems. The UCC5881-Q1 includes an integrated 10-bit Analog-to-Digital Converter (ADC) that enables monitoring of up to 2 analog inputs, VCC2, DESAT, and the gate driver temperature. This driver supports primary-side and secondary-side Active Short Circuits (ASC). The UCC5881-Q1 offers under-voltage and over-voltage protection on internal and external supplies. This driver is AEC-Q100 qualified for automotive applications. The UCC5881-Q1 driver is used in applications such as HEV traction inverters and EV/HEV power modules.
Features
- AEC-Q100 qualified:
- Device temperature grade 1: -40°C to 125°C ambient operating temperature temperature
- Device HBM ESD classification level 2
- Device CDM ESD classification level C2b
- Dual-output driver with real-time variable drive strength:
- ±15A and ±5A drive current outputs
- Digital input pins for drive strength adjustment without SPI
- 3 resistor settings R1, R2, or R1||R2
- Integrated 4A active Miller clamp or optional external drive for Miller clamp transistor
- Primary-side and secondary-side Active Short Circuit (ASC) support
- Under-voltage and over-voltage protection on internal and external supplies
- Driver die temperature sensing and overtemperature protection
- Short-circuit protection:
- 110ns response time to DESAT event
- DESAT protection - selections up to 14V
- Shunt resistor-based Short-Circuit (SC) and Over-Current (OC) protection
- Configurable protection threshold values and blanking times
- Programmable Soft Turn-Off (STO) and Two-level Soft Turn-Off (2STO) current
- Integrated 10-bit ADC:
- Able to measure power switch temperature, DC Link voltage, driver die temperature, DESAT pin voltage, and VCC2 voltage
- Programmable digital comparators
- Advanced VCE/VDS clamping circuit
- Functional safety-compliant:
- Developed for functional safety applications
- Documentation available to aid ISO 26262 system design up to ASIL D
- Integrated diagnostics:
- Built-In Self-Test (BIST) for protection comparators
- Gate threshold voltage measurement for power device health monitoring
- INP to transistor gate path integrity
- Internal clock monitoring
- Fault alarm and warning outputs
- ISO communication data integrity check
Applications
- Electric Vehicle (EV) and Hybrid Electric Vehicle (HEV) traction inverters
- EV and HEV power modules
Schematic Diagram
Additional Resource
Publicado: 2025-01-17
| Actualizado: 2025-05-06